For analytical research and high quality routine analyses equipped in basic configuration with:
		EI/CI ion source
		Reference inlet system
		Detection system for positive/negative ions
		Direct inlet system
		MS/MS techniques (MIKES, linked scans and constant neutral loss)
		Multi-tasking instrument-control-system (MICS) and data system based on Microsoft-Windows & trade

Additional modules for system expansion:
		Combination API/EI ion source
		GC/MS and LC/MS
		Liquid SIMS (FAB Pendant)
		EI/FD/FI device
		Orthogonal Time-of-Flight analyzer in BE-ToF configuration for high energy and low energy MS/MS experiments of highest specificity and sensitivity
		Multi-sector twin/tandem configurations